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Version |
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Inspection of original filter |
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Inspection of housing status, AR of product,
and IR surface |
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Inspection for foreign substances, staining,
S/C, spots, and chipping |
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Application |
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Camera module inspection ,
Lens & Filter
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Wafer die inspection |
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LED , Semiconductor die inspection |
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CCD, CMOS sensor inspection |
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classification |
Spec
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Vision System |
Camera Resolution |
Area Camera 4K (4096Fixel) |
Optical FOV (mm)
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7mm |
Resolving Power(H x V , ㎛)
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1.95㎛ |
Moving Stage(Motor & Robot)
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Ball Screw & Servo Motor
Isolated I/O Board (contact signal control) |
Software
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Image processing
Graphic User Interface
Option and recipe setting and management
Motion Control
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Minimum inspection size of particles
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About 10㎛ |
Light System |
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Special Lighting System optimized to IR-Filter |
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As the camera and the computer may be influenced by the vibration of a system when installing
devices and structures, separate installation of them is recommended.
The specification may be changed depending upon the condition.
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